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HSM Series (HSM200S)
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| Features |
MIL-STD-704D, MIL-STD-810E, and MIL-S-901C |
| How To Order | |
| Series: | HSM |
| Total Output Power: | 200 |
| Single Output: | S |
| Output Voltage: | 5.2 |
| Options: | -I metric inserts (M2.5) |
| Input Voltage: | 270 |
| MIL-STD-883 Screening (Optional) | 883 |
| Options: | I- metric inserts (M2.5) |
| Example: Standard unit is 270 Vdc nominal input with pins out the top written as HSM200S/5.2(270). | |
| Accessory Products | |
| SMF200: | EMI Filter to meet MIL-STD-461C |
| SMR: | AC Front End Recifier (for 270 Vdc input) |
| SMRA: | Ripple Attenuation Module to reduce ripple to <20 mV P-P |
| Selection Chart | ||
| Nominal Output (Vdc) | Output Current (Amps) | Model Number |
|---|---|---|
| 2.0 | 40 | HSM200S/2.0 |
| 3.3 | 40 | HSM200S/3.3 |
| 5.0 | 40 | HSM200S/5.0 |
| 5.2 | 38 | HSM200S/5.2 |
| 12 | 20 | HSM200S/12 |
| 15 | 16 | HSM200S/15 |
| 24 | 11 | HSM200S/24 |
| 28 | 10 | HSM200S/28 |
| 48 | 5.0 | HSM200S/48 |
| Input Characteristics, 270 Vdc Input | ||||
| Min | Typ | Max | Units | |
|---|---|---|---|---|
| Input Voltage | 200 | 270 | 400 | Vdc |
| Brown Out (75%) Full Load | 175 | Vdc | ||
| No Load Power Dissipation | 10 | 15 | Watt | |
| Inrush Charge | 1.5 | mc | ||
| Reflected Ripple Current | 15 | % | ||
| Logic Disable Current (Sink) | 0.1 | 0.8 | mA | |
| Logic Disable Power In | 1 | 3 | W | |
| Input Ripple Rejection (120 Hz) | 60 | dB | ||
| Input Overvoltage (No Damage) | 400 | 500 | Vdc | |
| Efficiency | 70-75 | % | ||
| Efficiency (2V & 3.3V) | 50-60 | % | ||
| EMI | Unit conforms to MIL-STD-461C (on the input leads) with companion filter |
| Input Transient | Units conform to MIL-STD-704D (500 Vdc for 0.1 second) |
| Output Characteristics | ||||
| Min | Typ | Max | Units | |
|---|---|---|---|---|
| Set Point Accuracy | 1* | % Vout | ||
| Load Regulation | 0.02 | 0.2 1 | % Vout | |
| Line Regulation | 0.02 | 0.2 2 | % Vout | |
| Ripple P-P (25 MHz) | 1.0 | 3.0 3 | % Vout | |
| Trim Range (5V, 5.2V min = 85%) | 60 | 115 | % Vout | |
| Trim Range (2V, 3.3V) | 100 | 115 | % Vout | |
| Remote Sense Compensation | 0.5 | Vdc | ||
| Overvoltage Protection | 115 | 125 | % Vout | |
| Current Sharing | +10 | % Iout | ||
| Transient Response (Vout 1%) Time / Overshoot | ||||
| 20 - 80% Load | 400 / 400 4 | µS/mV | ||
| Low Line-High Line | 400 / 400 5 | µS/mV | ||
| 50 - 100% | 400 / 400 6 | µS/mV | ||
| Temperature Drift | 0.01 | 0.02 | %/oC | |
| Long Term Drift | 0.01 | 0.02 | %/1KHrs | |
| Current Limit | 105 | 150 | % Iout | |
| Short Circuit Current | 50 | % Iout | ||
| Turn On Time | 100 | mS | ||
| Logic Turn On Time | 100 | mS | ||
| Tracking Accuracy | N/A | |||
* 1% or 50mV, whichever is
greater
1 0.2% or 20mV, whichever is greater
2 0.1% or 25mV, whichever is greater
3 3% or 150mV, whichever is greater
4 3% or 400mV, whichever is greater
5 5% or 400mV, whichever is greater
6 2% or 400mV, whichever is greater
| Isolation Characteristics | ||||
| Min | Typ | Max | Units | |
|---|---|---|---|---|
| Isolation: | ||||
| Input to Output | 1000 | Vdc | ||
| Output to Base | 500 | Vdc | ||
| Input to Base (270 Vdc in) |
1000 | Vdc | ||
| Input to Output Capacitance | 0.01 | 0.03 | µF | |
| Insulation Resistance (@50 Vdc) | 50 | MOhm | ||
| Mechanical Characteristics | ||
| Weight | 10.42 | oz |
| 295.50 | grams | |
| Size | 2.40 x 2.30 x 1.12 | inch |
| 60.96 x 58.42 x 28.45 | mm | |
| Volume | 6.18 | inch3 |
| 101.32 | cm3 | |
| Material | Pin |
Brass (solder Plating) |
| Case | Aluminmum 5052-H32 | |
| Finish | Nickel Plating | |
| Temperature Characteristics | ||||
| Min | Typ | Max | Units | |
|---|---|---|---|---|
| Operating (Baseplate) | -55 | +100 | oC | |
| Storage (Ambient) | -55 | +125 | oC | |
| Over Temperature Shutdown | +105 | oC | ||
| Thermal Resistance Case - Ambient | 5 | oC/W | ||
| MIL-STD-883 Screening (Optional) | |
| Stabilization Bake: | +125oC for 24 hours per M1108, Condition B |
| Temperature Cycling: | 10 cycles at -55oC to +125oC (transition period 36 minutes) per M1010, Condition B |
| Burn-in: | 160 hours at +100oC minimum |
| Final Testing | |